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Electron Microscopy Solutions

Introduction to Vion Plasma FIB

Wide range of materials characterization, failure analysis, and sample preparation

Vion PFIB adds significantly more capacity to your lab with best-in-class milling and imaging performance in a single, easy-to-use instrument. Increase throughput over conventional gallium-based FIB by more than 20 times for site-specific, cross-sectional milling and large region of interest preparation for other analytical techniques.

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