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Electron Microscopy Solutions
    

Application Example: Talos TEM and the NanoEx holder

The ability to perform compositional analysis for in situ elemental characterization of nanomaterials, both at room temperature and during heating, provides important insight to structural and compositional changes. In this use case, we demonstrate the use of NanoEx-i/v in the dynamic inter-diffusion process of Silicon through an Aluminum oxide interlayer which results in the growth of large crystalline grains of Silicon, used to design solar cells and transistors. To understand the compositional and structural changes induced by the applied heating, the Al and Si elemental live maps were acquired at every temperature.

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