|   Electron Microscopy Solutions

Electron Microscopy Solutions

Introducing the Scios 2 FIB-SEM

Best-in-class sample prep and 3D characterization for widest range of samples

Introducing the Thermo Scientific™ Scios™ 2 FIB-SEM. Learn how this ultra-high resolution analytical system provides outstanding sample preparation and 3D characterization performance for the widest range of samples, including magnetic and nonconductive materials.  

Please provide or confirm your information to access your video.

Tags : Scios 2; DualBeam; FIB-SEM

View your video