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Electron Microscopy Solutions
Scanning Electron Microscope

Apreo SEM

The most versatile high-performance SEM

The Apreo scanning electron microscope's (SEM) revolutionary compound lens design combines electrostatic and magnetic immersion technology to yield unprecedented resolution and signal selection. This makes the Apreo SEM the platform of choice for research on nanoparticles, catalysts, powders and nanodevices, without compromising on magnetic sample performance.

The Apreo SEM benefits from the unique in-lens backscatter detection, which provides excellent materials contrast, even at tilt, short working distance, or on sensitive samples. The novel compound lens further improves contrast with energy filtering and adds charge filtering for imaging of insulating samples. The optional low vacuum mode now has a 500 Pa maximum chamber pressure for imaging even the most demanding insulators.

With all these options, including the compound final lens, advanced detection and flexible sample handling, the Apreo SEM's performance and versatility will meet your research challenges for many years to come.

Apreo SEM for Materials Science

The new Apreo scanning electron microscope (SEM) delivers performance for a broad range of materials including nanoparticles, metals, composites and coatings, and incorporates innovative features to for better resolution, contrast and ease of use.

  • The unique compound final lens delivers an exceptional resolution of 1.0 nm at 1 kV, without the need for beam deceleration - on any sample, even if it is tilted or topographic.
  • The most useful backscatter detection - materials contrast is always available, even at low voltage and beam currents, at any tilt angle, on beam sensitive samples and at TV-rate imaging.
  • Unparalleled detector flexibility - obtain the contrast or signal intensity that matters most by combining information from individual detector segments.

Product Models