High-speed, large-area cross-sectioning and material removal
The Vion Plasma FIB adds significantly more capacity to your lab with best-in-class milling and imaging performance in a single, easy-to-use instrument. Increase throughput over conventional gallium-based FIB by more than 20 times for site-specific, cross-sectional milling and large region of interest preparation for other analytical techniques.
Introducing the Vion Plasma FIB from FEI. The Vion Plasma Focused Ion Beam system (PFIB) is especially well-suited for metals, composites, and coatings.