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SEM

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FIB

Semeuse

Defect made of silver paste, similar to the famous "Semeuse" engraved by Oscar Roty . This character has been widely used for french coins.

Courtesy of Dr. Cyril GUEDJ , CEA, LETI, MINATEC Campus

Taken by FIB microscope

Magnification: 50 X
Sample: silver paste on silicon
Detector: SE
Voltage: 5 kV
Vacuum: 1mbar
Horizontal Field Width: 2.2 mm
Working Distance: 5.0
Spot: 1.0

YMnO3 thin film Grown by MOCVD on Silicon Substrate

YMnO3 thin film grown by MOCVD on silicon substrate at 850°C. Image taken by Ionela Iliescu and Patrick Chaudouet.

Courtesy of IONELA ILIESCU

Taken by Quanta SEM microscope

Magnification: 5,000x
Sample: YMnO3
Detector: SE
Voltage: 15 kV
Vacuum: HV
Working Distance: 10.5

TSV Sectioned and Imaged 2

TSV sectioned and imaged by a Plasma-FIB system running an ICP ion source.

Courtesy of Fraunhofer IWM Halle, prepared in the ENIAC ESIP project

Taken by Vion Plasma microscope

Detector: CDEM
Horizontal Field Width: 21.3 μm
Working Distance: 16.5 mm

Fib milling

The V400ACE creates a well.

Taken by V400ACE microscope

Voltage: 30 kV
Horizontal Field Width: 137 μm
Spot: 24 pA

Juniper Needles

Tips of some Juniper Bush needles. The image was acquired in ESEM mode.

Courtesy of Mr. William Monroe , University of Alabama at Birmingham

Taken by Quanta SEM microscope

Sample: Juniper Bush Needles
Detector: GAD
Voltage: 20 kV
Vacuum: 4 Torr
Horizontal Field Width: 275 μm

Opposing Fronts

Image of a felt marker tip; courtesy of student Maria Mendoza.

Courtesy of Alyssa Calabro

Taken by Quanta 3D microscope

Tellurium and Bismuth

Tellurium and Bismuth nano powder

Courtesy of Catherine Bibby

Taken by Tecnai microscope

Magnification: 9900x
Sample: nano powder
Detector: HAADF
Voltage: 200 kV
Horizontal Field Width: 6.9 microns
Working Distance: 546 mm
Spot: 5

Short circuit causing dendrites.

Short circuit causing dendrites.

Courtesy of Mr. Daniel Rigler , Budapest University of Technology and Economics

Taken by Inspect microscope

Salmonella Bacteria

This image is of salmonella bacteria, a low kV was essential in order to visualise the surface detail of the bacteria, so the image was taken with the VcD (backscatter detector), using beam decelleration.

Courtesy of Miranda Waldron

Taken by Nova NanoSEM microscope

Magnification: 80,000x
Sample: Bacteria
Detector: VcD
Voltage: 1 kV
Horizontal Field Width: 3.73μm
Working Distance: 5.9 mm
Spot: 2 nA

YMnO3 Thin Film grown by MOCVD

YMnO3 thin film grown by MOCVD (Metalorganic vapour phase epitaxy) on silicon substrate at 850°C. Image taken by Ionela Iliescu and Patrick Chaudouet.

Courtesy of IONELA ILIESCU

Taken by Quanta SEM microscope

Magnification: 5,000x
Sample: YMnO3
Detector: SE
Voltage: 15 kV
Vacuum: HV
Working Distance: 10.5

RICE

inside white rice

Courtesy of Mr. Wadah Mahmoud , The University of Jordan

Taken by Inspect microscope

Magnification: 10000
Sample: eating rice
Detector: SE
Voltage: 3.0 kV
Vacuum: high
Working Distance: 11.6
Spot: 3.0

Microfluidic Device

Direct automated patterning of a 1mm microfluidic device into silicon. Product: Helios NanoLab DualBeam

Taken by Helios NanoLab microscope

Silica Nanospheres

Silica nanospheres exposed to laser radiation on a silicon substrate.

Courtesy of Luca Boarino

Taken by Inspect microscope

Magnification: 6000x
Sample: Silicon
Detector: SE
Voltage: 2 kV
Vacuum: 0.3 mbar
Horizontal Field Width: 5µm
Working Distance: 15 mm
Spot: 3.0 nA

cysteine rose

It is a crystal of cysteine produced drying an high concentrate solution of cysteine on a silicon nitrite substrate

Courtesy of Mr. Andrea Jacassi , Istituto Italiano di Tecnologia

Taken by Helios NanoLab microscope

Magnification: 3998x
Voltage: 5kV
Horizontal Field Width: 37.3 um
Working Distance: 5.4mm

ZnO nanorods - "nanopencils"

hydrothermal growth of ZnO nanorods - "nano pencils"

Courtesy of Dr. Cornel Munteanu , Institute of Physical Chemistry Ilie Murgulescu

Taken by Quanta SEM microscope

Magnification: 40000
Detector: SE-ETD
Voltage: 20
Horizontal Field Width: 3.73
Working Distance: 10
Spot: 4.5

TSV Crossection 01

TSV Crossection 01, Helios G4 PFIB

Taken by Helios G4 PFIB microscope

Zeolite Particles

Lattice information revealed on Zeolite particles using 30 kV STEM bright field Product: Verios SEM

Taken by Verios XHR SEM microscope

Nevirapine Twin Towers

Nevirapine sublimate residue (Pharmaceutical)

Courtesy of Dr. Louwrens Tiedt , North-West University, Potchefstroom Campus, Potchefstroom

Taken by Quanta SEM microscope

Magnification: 76X
Sample: Nevirapine
Detector: SE
Voltage: 10kV
Vacuum: 1017e-6 Torr
Horizontal Field Width: 1.98 mm
Working Distance: 24.1 mm
Spot: 3.9

FIB-Patterned Silicon

There are two membranes with nanosized holes in silicon, produced by focused ion beam milling. The total width of each membrane is about 150 nm. The diameter of big holes is about 400 nm and small holes - 150 nm. Such structures can be applied in systems on chip.

Courtesy of Alexey Kolomiytsev

Taken by DualBeam microscope

Magnification: 20,000x
Detector: SE
Voltage: 15 kV
Horizontal Field Width: 12.8 μm
Working Distance: 5.1

Utricularia Aurea Seed

Utricularia Aurea Seed

Courtesy of Azizi Abd. Jalil

Taken by Quanta SEM microscope

Magnification: 2500x
Detector: SE
Voltage: 10kv
Vacuum: 60Pa
Horizontal Field Width: 40μm
Working Distance: 20.4 mm
Spot: 5 nA

Powder Metallurgical Molybdenum

Powder metallurgical molybdenum based alloy containing hafnium- and molybdenum-carbides.

Courtesy of Christopher Pöhl

Taken by Versa 3D microscope

Magnification: 10000x
Sample: molybdenum alloy
Detector: SE
Voltage: 20 kV
Horizontal Field Width: 20.8 µm
Working Distance: 9.9 µm
Spot: 5.5

Nanoindent of Copper

Nanoindent on deformed copper imaged with channeling contrast. Nanoindentation is a tool to measure the hardness very localised at a low force. Therefore surface defects such as scratches or, as can be seen here, the oxide layer might have an influence on the measurement.

Courtesy of Joern Leuthold

Taken by Nova NanoSEM microscope

Magnification: 15000x
Sample: Copper
Detector: vCD
Voltage: LE 3kV
Vacuum: 10^-6
Horizontal Field Width: 20
Working Distance: 5.2mm
Spot: 3

Cryo on Danish Cheese

Hight vacuum cryo (Quorum PP2000)image of an un-coated Danish variety of cheese, which was plunged freeze into liquid nitrogen.

Courtesy of Ramona Mateiu

Taken by Quanta SEM microscope

Magnification: 5034X
Sample: Cheese
Detector: ETD
Voltage: 1.8
Vacuum: HV
Horizontal Field Width: 50.9 um
Working Distance: 5.8
Spot: 1.5

Tricomes on Squash leaf surface_3

Tricomes on Squash leaf surface Order: Cucurbitales Family: Cucurbitaceae Genus_species: Cucurbita maxima Scanning electron microscope image of squash leaf tip area

Courtesy of Louisa Howard

Taken by Quanta SEM microscope

Magnification: 100
Sample: botanical_leaf
Detector: SE
Voltage: 15kV
Working Distance: 15.6
Spot: 3.0

Crazing of Paint

An area of Pt thin film deposited on the surface of a polished fine grained sample. Subjected to tensile mechanical stress, substrate and thin film show a different plastic behavior. Mixed together and material information was obtained by the use of the solid state below the lens detector in addition to beam deceleration.

Courtesy of Joern Leuthold

Taken by Nova NanoSEM microscope

Magnification: 16000x
Detector: vCD
Voltage: 3kV--LE 2keV
Vacuum: 3*10^-5
Horizontal Field Width: 18.6µm
Working Distance: 5.3 mm
Spot: 2 nA