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Electron Microscopy Solutions

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X-FEG module for Titan

Key Benefits

  • Maximize analytical probe currents to improve lateral resolution in chemical analysis.
  • Enhance time to result and signal to noise ratio in S/TEM imaging and chemical analysis.
  • Improve spatial coherence for holography and HR-TEM applications.
  • Benefit from the excellent stability of the emission in automated experiments.
  • The ease of use coupled with the long life time and robustness of Schottky emitter technology maximizes your throughput.
  • Explore the frontiers in electron microscopy with the combination of an X-FEG with corrector and monochromator technology.
  • Upgrade your Titan S/TEM with the new X-FEG to boost your perfor mance.

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