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The Themis S S/TEM delivers sub-Å resolution, the fastest energy dispersive X-ray spectroscopy (EDS) collection, and the flexibility to address other critical semiconductor use cases, such as strain measurement and low-dose, high-contrast imaging (iDPC). The Themis S S/TEM addresses the needs of materials analysis labs that require high throughput, high quality, and versatility, particularly semiconductor failure analysis labs working at the sub-20nm technology node.
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