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Scios 2 Datasheet

The innovative NICol™ electron column provides the foundation of the system’s high-resolution imaging and detection capabilities. It offers excellent nanoscale details, using the widest range of working conditions, whether operating at 30 keV in STEM mode to access structural information or at lower energies to obtain charge-free, detailed information from the surface. With its unique in-lens Trinity™ detection technology, the system is designed for simultaneous acquisition of angular and energy-selective SE and BSE imaging.

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