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Helios G4 UC for Materials Science datasheet

Helios G4 UC incorporates a suite of state-of-the-art technologies that enable simple and consistent high-resolution S/TEM and Atom Probe Tomography (APT) sample preparation, as well as the highest-quality subsurface and 3D characterization, even on the most challenging samples.

Key Benefits

  • Fastest and easiest preparation of high quality, site-specific,TEM and APT samples using the Tomahawk ion column
  • Shortest time to nanoscale information using best-in-class Elstar™ electron column
  • Reveal the finest details with the next generation UC+ monochromator technology with higher current, enabling sub-nanometer performance at low energies
  • The most complete sample information with sharp, refined, and charge-free contrast obtained from up to 6 integrated in-column and below-the-lens detectors
  • The highest quality, multi-modal subsurface and 3D information with the most precise targeting of the region of interest using optional Auto Slice & View™ 4 (AS&V4) software
  • Fast, accurate, and precise milling and deposition of complex structures with critical dimensions of less than 10 nm
  • Precise sample navigation tailored to individual application needs thanks to the high stability and accuracy of 150 mm Piezo stage and in-chamber Nav-Cam
  • Artifact-free imaging based on integrated sample cleanliness management and dedicated imaging modes such as SmartScan™ and DCFI

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