|   Electron Microscopy Solutions

      
Electron Microscopy Solutions
      

Download the datasheet

Helios G4 PFIB UXe Datasheet for Materials Science

Helios G4 PFIB delivers unmatched capabilities for large volume 3D characterization, Ga+ free sample preparation and precise micromachining.

Helios G4 PFIB UXe is part of the fourth generation of the industry leading Helios DualBeam family. It combines the new PFIB 2.0 column and the Monochromated Elstar™ SEM column to deliver the most advanced focused ion- and electron beam performance. Intuitive software and an
unprecedented level of automation and ease-of-use provide observation and analysis of relevant subsurface volumes by scientists and engineers.

Please provide or confirm your information to download your document.

Download

Fields marked with an asterisk (*) are required

*
* 
* 
* 
* 
* 
*


 
I’d like to receive information about Thermo Scientific products and services via email.
 
*
 
submitting your request...