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Helios G4 FX For Materials Science Datasheet

Helios G4 FX is part of the fourth generation of the industry leading Helios DualBeam family. It is carefully designed to meet the needs of scientists and engineers by offering the best all-in-one STEM sample preparation and imaging solution. The Helios G4 FX combines the innovative Elstar electron column with high-current UC+ technology for extreme high-resolution imaging and highest materials contrast, in-lens STEM 4 for sub-3Å in situ low kV STEM imaging and the superior Phoenix ion column for the fastest, easiest, and most precise high-quality sample preparation. In addition to the most advanced electron and ion optics, the Helios G4 FX incorporates a suite of state-of-the-art technologies that enable simple and consistent high-resolution S/TEM and Atom Probe Tomography (APT) sample preparation, as well as the highest-quality subsurface and 3D characterization, even on the most challenging samples.

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