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Analytical characterization of light elements like Lithium
is very challenging or sometimes impossible with techniques available for
DualBeam (FIB-SEM) instruments based on the electron signature of the analyzed
sample. The same is applicable to high resolution material analysis for samples
with very low element concentrations. The TOF-SIMS detector
(Time-of-Flight secondary ion mass spectrometer) enables very sensitive surface
analysis for many industrial and research applications. The technique provides
detailed elemental and isotopic information about the sample and is capable of
depth profiling analysis.
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7Li+ distribution map (left) and Li, Ni, Mn and Co elements depth profile (right) in a lithium-ion battery
cathode. Horizontal field width (HFW) of the image is 40µm.
19F- SIMS image shows the distribution of the polyvinylidene fluoride binder in the lithium-ion battery cathode. SEM/EDS is very challenging for mapping the binder element fluoride distribution, but can be efficiently imaged using SIMS technique.
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