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Scientific Papers

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M&M 2007

Title:
Practical Electron Microscopy with Correctors and Monochromators [PDF 86KB]
Authors:
J. Ringnalda, B. Freitag, D. Hubert, and M. Stekelenburg
Title:
Site-specific observation and 3D studies of soft materials using cryo-FIB SEM [PDF 562KB]
Authors:
DJ Stokes, MF Hayles, D Phifer & H Fujitani
Title:
Nanolithography of electrically insulating materials using simultaneous defocused primary electron beam and focused ion beam irradiation [PDF 612KB]
Authors:
DJ Stokes, T Vystavel & O Wilhelmi
Title:
Nanostructure Fabrication by Ultra-high Resolution Environmental Scanning Electron Microscopy [PDF 470KB]
Authors:
M Toth; FEI Company; C Lobo; University of Technology Sydney, Australia; R Knowles; FEI Company; M Phillips; University of Technology Sydney, Australia; M Postek, A Vladar; National Institute of Standards and Technology
Title:
Noise Level in Electron Holograms-The impact of CCD Camera and Hologram Reconstruction Parameters [PDF 353KB]
Authors:
E. Voelkl,P.E. Mooney, J. Niehus, R. Gauvin
Title:
Automated 3D Imaging at Ambient and Cryogenic Conditions [PDF 16KB]
Authors:
Marc Storms, Remco Schoenmakers, Wim Voorhout, Wim Busing, Uwe Lucken, Werner Hax
Title:
Static vs. Dynamic FIB/SEM Methods For 3D Modeling [PDF 295KB]
Authors:
Brandon Van Leer and Lucille A. Giannuzzi
Title:
Imaging Deep Trap Distributions by Environmental Scanning Electron Microscopy [PDF 78KB]
Authors:
Toth, R Knowles; FEI Company; M Phillips; University of Technology Sydney, Australia
Title:
Noise Considerations in Low Vacuum Scanning Electron Microscopy [PDF 111KB]
Authors:
V Tileli; University at Albany; M Toth, R Knowles; FEI Company; BL Thiel; University at Albany
Title:
Evidence for a Critical Amorphization Thickness Limit of Ga Ion Bombardment in Si [PDF 283KB]
Authors:
Lucille A. Giannuzzi, Brandon Van Leer, and Jan Ringnalda
Title:
Performance and Applications of the Aberration Corrected TEM and STEM Instruments at the Ernst Ruska-Centre [PDF 111KB]
Authors:
J Mayer, L Houben; Ernst Ruska Centre, Research Centre Juelich, Germany; S Lopatin; FEI Company, Netherlands; M Luysberg, A Thust; Ernst Ruska Centre, Research Centre Juelich, Germany
Title:
New Developments in Focal-Series Reconstruction [PDF 1MB]
Authors:
P. Schlossmacher, Ch. Kuebel*, B. Freitag, D. Hubert and R. Perquin
Title:
High Resolution Scanning Electron Microscopy Examination of Polymer Morphology [PDF 551KB]
Authors:
J Blackson, E Garcia-Meitin; Dow Chemical Company; M Darus; FEI Company
Title:
A Novel Automated Method to Measure Strain at the Nano Scale [PDF 207KB]
Authors:
B. Freitag, J. Stanley, E. Sourty, J. Ringnalda, and D. Hubert
Title:
Improved EBSD Sample Preparation Via Low Energy Ga FIB Ion Milling [PDF 45KB]
Authors:
J.R. Michael and Lucille A. Giannuzzi
Title:
Atomic Resolution Cs-Corrected HR-S/TEM from 80-300kV: Optimizing for Technique and Material [PDF 106KB]
Authors:
B. Freitag, M. Stekelenburg, J. Ringnalda, and D. Hubert
Title:
FIB/DualBeam Techniques for Quantitative Analyses [PDF 20KB]
Authors:
Lucille A. Giannuzzi
Title:
Adapting the spatial-frequency band pass of in-focus phase-contrast apertures for biological applications [PDF 399KB]
Authors:
R.M. Glaeser, D. Typke, K.H. Downing, P.C. Tiemeijer, R. Cambie, J.Jin
Title:
Computed Tomographic Spectral Imaging: 3D STEM-EDS Spectral Imaging [PDF 244KB]
Authors:
P.G. Kotula, L.N. Brewer, J.R. Michael, and L.A. Giannuzzi
Title:
Advances in Serial Block Face Dualbeam Electron Microscopy for the Exploration of Cortical Circuits [PDF 1.2MB]
Authors:
B Lich; FEI Company, Netherlands; G Knott; University of Lausanne, Switzerland
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