Upgrades & Accessories

FEI Instruments are built to grow with you. We offer a wide range of upgrades and accessories to enhance your instrument's performance and capabilities, making your investment more flexible, extensible, and customizable. Our selection includes parts and add-ons for Scanning Electron Microscopes (SEMs), Transmission Electron Microscopes (TEMs), DualBeams™, and Focused Ion Beams (FIBs).

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Featured Additions

Enhanced Imaging and Patterning Solution

The enhanced Imaging and Patterning solution enables greater control of patterning and enhances the patterning and imaging capabilities of your small DualBeam™ system.

Microscope Control Upgrade

Microscope control upgrade contains hardware and software that enhances the ease of operation with embedded application software, ensures the full benefit of your systems' leading edge performance and also prepares your instrument for future developments.

X-FEG Module for Titan™

The X-FEG is a unique high brightness module that enables dramatically improved imaging and spectroscopy performance without adding operating complexity.

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