Bridging the gap between optical and electron
The Phenom™ Desktop SEM is a high-resolution desktop imaging tool that is fast, affordable, and easy to use.
Electron microscopy enables you to view morphology on the submicron and nanoscale. However, it requires a significant investment and highly trained operators. Optical microscopes are affordable, widely used, and produce fast results for routine imaging tasks. Unfortunately, they can only resolve to the micron level and have a limited depth of focus and contrast.
The Phenom Desktop SEM delivers a large depth of focus, high contrast, and takes you from unprocessed samples to 20,000x magnification in under 30 seconds -- all in one integrated, easy-to-use microscope system.
Key Specifications
- Fastest time to data with 30 second sample loading
- High brightness thermionic source
- Multi-mode detector for topographic imaging
- Motorized stage for easy navigation
- Low vacuum design for a wide variety of samples
Additional Information
Use the information below to register for demos, sign up for webinars, and learn more about the Phenom Desktop SEM.
* These links will take you off FEI.com to the Phenom-World.com website